Scanatspeed

PDF | The authors describe new strategies where at-speed scan tests can be applied with internal PLL. They present techniques for optimizing ATPG across.

In this technique, the entire scan data shifting can be done at slow speeds in test mode, and then two at-speed clocks are pulsed for launch and capture in ...

由 V Vorisek 著作 · 被引用 20 次 — An innovative method of scan pattern timing creation based on the results from Static Timing Analysis is pre- sented. The paper also describes the usage of a ...

2016年10月8日 — at-speed 就是实速测试， 主要用于scan测试－即AC测试，和mbist测试。这种测试手段的目的是－测试芯片在其工作频率下是否能正常工作，实速即实际速度。

Both work by generating scan patterns that can be scanned in at a slow speed. After a scan vector is scanned in, two or more capture clocks are applied at full ...

2020年12月28日 — 1.at speed test structure and OCC Controller. 2.OCC Controller. 当使用set_dft_configuration -clock_controller enable运行insert_dft.

A second common type of fault model is called the “transition” or “at-speed” fault model, and is a dynamic fault model, i.e., it detects problems with timing.

The Speed Scan and Index in IBM Datacap Navigator provides high-speed scanning and indexing scenarios for better performance, as well as enhanced ...

At-speed scan testing is becoming more and more popular in the semiconductor industry, as the relevance of delay-induced defects increases with CMOS process ...

2018年2月15日 — Generally the scan part can be understood as a way to discover stuck at faults, at speed faults. Stuck at fault: It model. Continue Reading.